Conveners
Awards and Challenges: Best Manager Award (Lourdes Pozueta Fernández)
- Jean-Michel Poggi
Awards and Challenges: Young Statistician Award (Raffaele Vitale)
- Bjarne Bergquist
Awards and Challenges: George Box Medal (William Q. Meeker)
- Antonio Pievatolo
Awards and Challenges: Greenfield Challenge (Antonio Pievatolo)
- Antonio Pievatolo
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Lourdes Pozueta Fernández (Professor at the Industrial Engineering School at UPC, Barcelona, Project Leader at the Technological Centre in Spain, TECNALIA, and CEO of AVANCEX)29/09/2020, 15:00
The ease of data collection in the industry is a great opportunity to do business working to reduce costs of inefficiencies. However, having the opportunity to collect data does not imply achieving value with its treatment. There are numerous weak elements in the culture of organizations related to the ability of people to exploit the value of data. Currently the habit of looking at data as...
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Raffaele Vitale (Postdoctoral Associate at KU Leuven, Belgium)29/09/2020, 15:30
Although Principal Component Analysis (PCA) and Partial Least Squares regression (PLS) are currently recognised as some of the most powerful approaches for the analysis and interpretation of multivariate data especially in the field of industrial processes, strong non-linear relationships among objects and/or variables may represent a difficult issue to solve when one tries to model them by...
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William Q. Meeker (Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University, USA, a past Editor of Technometrics, ASQ Shewhart Medal and ASA’s Deming Lecture Award winner)30/09/2020, 15:15
Warranty return data from repairable systems, such as home appliances, lawn mowers, computers, and automobiles, result in recurrent event data. The non-homogeneous Poisson process (NHPP) model is used widely to describe such data. Seasonality in the repair frequencies and other variabilities, however, complicate the modeling of recurrent event data. Not much work has been done to address the...
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Antonio Pievatolo, Katy Klauenberg30/09/2020, 17:00
Inspections according to statistical sampling plans allow conclusions to be drawn about the reliability of a whole population of e.g. measurement devices. However, confirming high reliability levels requires large sample sizes and is thus expensive or even infeasible.
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When reliability is judged by not exceeding a certain threshold, considerably more efficient attribute sampling plans can be...