Sep 6 – 10, 2026
Centro Didattico Morgagni
Europe/Rome timezone

XAI for signal diagnosis in SPM

Not scheduled
20m
Centro Didattico Morgagni

Centro Didattico Morgagni

Viale Morgagni 40, Firenze
Other/special session/invited session

Speaker

Inez Zwetsloot (University of Amsterdam)

Description

Artificial Intelligence (AI) has shown become very popular as modelling strategy within statistical process monitoring (SPM), particularly in detecting abnormal process behaviours. However, for existing AI-based SPM methods, diagnosing features associated with signal remains challenging, as traditional diagnosis methods are not directly applicable. This lack of diagnosis makes it difficult to make an out-of-control action plan and take appropriate actions once a signal is detected, and thus impedes the AI-based SPM methods from being applied in practice. Explainable AI (XAI) offers a promising framework for addressing this limitation by providing feature relevance information for the model outputs, which can help identify the features related to abnormal process behaviour. This work proposes a general framework for combining XAI with AI-based monitoring. Simulation studies and a real-world case study show the effectiveness of the proposed method.

Classification Mainly methodology
Keywords Signal diagnosis, XAI, statistical process monitoring

Primary authors

Inez Zwetsloot (University of Amsterdam) Mr Jiaqi Qiu (University of Amsterdam)

Presentation materials

There are no materials yet.