ENBIS-23 Valencia Conference

Session

CONTRIBUTED Industry 2

12 Sept 2023, 16:40

2.13

Conveners

CONTRIBUTED Industry 2

• András Zempléni (Eötvös Loránd University, Budapest)

154. Dynamic Bayesian Network-Based Run-to-Run Control Scheme for Optimal Quality Engineering in Semiconductor Manufacturing

Wei-Ting Yang (BI Norwegian Business School)

12/09/2023, 16:40

Industry

Run-to-Run (R2R) control has been used for decades to control wafer quality in semiconductor manufacturing, especially in critical processes. By adjusting controllable variables from one run to another, quality can be kept at desired levels even as the process conditions gradually change, such as equipment degradation. The conventional R2R control scheme calculates the adjustment value for the...

24. Multivariate Bayesian Mixed Model for Method Comparability

Olympia Tumolva (Janssen Pharmaceutica N.V., Janssen Pharmaceutical Companies of Johnson & Johnson, Belgium)

12/09/2023, 17:00

Industry

In pharmaceutical manufacturing, the analytical method to measure the responses of interest is often changed during the lifetime of a product due to new laboratory included, new equipment, or different source of starting material. To evaluate an impact of such change, method comparability assessment is needed. Method comparability is traditionally evaluated by comparing summary measures such...

81. Process Optimization Using Bayesian Models for Bounded Data

Chellafe Ensoy-Musoro (Janssen Pharmaceutica)

12/09/2023, 17:20

Industry

Design space construction is a key step in the Quality by Design paradigm in manufacturing process development. Construction typically follows the development of a response surface model (RSM) that relates different process parameters with various product quality attributes and serves the purpose of finding the set of process conditions where acceptance criteria of the objectives are met with...